How do you read ToF data on Sims?
TOF-SIMS spectra are typically displayed as a plot of signal intensity or ion counts on the Y-axis versus m/z on the X-axis. The height of a signal is proportional to the amount of that ion present in the spectrum and the m/z of the ion is basically the mass of that ion (if it is singly charged).
What is ToF-SIMS analysis?
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample. The particles are removed from atomic monolayers on the surface (secondary ions).
How does ToF-SIMS work?
How does ToF-SIMS work? ToF-SIMS uses a pulsed primary ion beam (Bin+, Cs+, Ar+, etc.) to impact on a sample surface and induce a fragmentation cascade. The result is the desorption of neutrals, secondary ions (+/-) and electrons from the first few monolayers of the sample.
What are the different types of data that can be obtained from ToF-SIMS measurements?
TOF-SIMS can provide mass spectral information; image information in the XY dimension across a sample; and also depth profile information on the Z dimension into a sample.
Which of the following is the TOF instrument?
Time of flight (TOF) mass spectrometers are analytical instruments broadly used in life science research in areas such as drug discovery, microbiology, cell biology, and protein biochemistry. The TOF mass analyzer accelerates ionized sample particles as a beam or by relfection toward a detector.
What can Sims detect?
Secondary Ion Mass Spectrometry (SIMS) detects very low concentrations of dopants and impurities. The technique provides elemental depth profiles over a wide depth range from a few angstroms (Å) to tens of micrometers (µm).
What is a TOF mass spectrometer used for?
Time of flight mass spectrometry (TOF–MS) is one approach to capturing a broad molecular weight range of signals associated with polar and nonpolar compounds in a single sample. This method uses an electric field to accelerate ions to the same potential.
What is Sim in mass spectrometry?
Selected ion monitoring (SIM) is a technique widely used for trace analysis. In this technique, rather than the mass spectrometer being set to scan over a pre-defined mass range and record full mass spectra it is set to monitor the intensity of specific m/z values.